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Volumn 7, Issue 3, 2008, Pages 226-230

Modeling thermal effects in nano-devices

Author keywords

Particle based simulations; SOI devices; Thermal effects

Indexed keywords

NANO-DEVICES; PARTICLE-BASED SIMULATIONS; SELF-HEATING EFFECTS; SOI DEVICES; THERMAL EFFECTS;

EID: 50949115616     PISSN: 15698025     EISSN: 15728137     Source Type: Journal    
DOI: 10.1007/s10825-008-0189-3     Document Type: Article
Times cited : (5)

References (5)
  • 2
    • 0035716659 scopus 로고    scopus 로고
    • Localized heating effects and scaling of sub-0.18 micron CMOS devices
    • Pop, E., Banerjee, K., Sverdrup, P., Dutton, R., Goodson, K.: Localized heating effects and scaling of sub-0.18 micron CMOS devices. In: IEDM Tech. Dig., p. 679, 2001
    • (2001) IEDM Tech. Dig. , pp. 679
    • Pop, E.1    Banerjee, K.2    Sverdrup, P.3    Dutton, R.4    Goodson, K.5
  • 4
    • 0037936539 scopus 로고    scopus 로고
    • Non-equilibrium thermal effects in SOI power transistors
    • Raman, A., Walker, D.G., Fisher, T.S.: Non-equilibrium thermal effects in SOI power transistors. Solid State Electron. 47, 1265-1273 (2003)
    • (2003) Solid State Electron. , vol.47 , pp. 1265-1273
    • Raman, A.1    Walker, D.G.2    Fisher, T.S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.