Component variability as a limit in digital electronics

Journal of Computational Electronics

Volumn 7, Issue 3, 2008, Pages 449-453

  Keyes, Robert W ^a  

^a IBM RESEARCH   (United States)

Author keywords

Gain; Negative resistance; Transistors; Variable components

Indexed keywords

COMPUTER NETWORKS; RESONANT TUNNELING; TRANSISTORS; TUBES (COMPONENTS); TUNNEL DIODES; VACUUM;

ACTIVE DEVICES; ELECTRONIC COMPUTERS; GAIN; NEGATIVE RESISTANCE; VARIABLE COMPONENTS;

SOLID STATE DEVICES;

EID: 50949115594     PISSN: 15698025     EISSN: 15728137     Source Type: Journal    
DOI: 10.1007/s10825-007-0171-5     Document Type: Article

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