Change of the in-plane Cu-O bond distribution in La2CuO4.1 across Tc

Journal of Physics and Chemistry of Solids

Volumn 69, Issue 9, 2008, Pages 2288-2291

  Mustre de Leon J ^a   Acosta Alejandro, M ^b   Conradson, S D ^c   Bishop, A R ^c  

^a DEPARTAMENTO DE FÍSICA APLICADA   (Mexico)

^b UNIVERSIDAD JUÁREZ AUTÓNOMA DE TABASCO   (Mexico)

^c LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION;

CU K-EDGE; IN-PLANE; X-RAY ABSORPTION FINE STRUCTURE;

COPPER;

EID: 50949108706     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2008.04.024     Document Type: Article

References (27)

1. Derro D.J., Hudson E.W., Lang K.M., Pan S.H., Davis J.C., Markert J.T., and de Lozanne A.L. Phys. Rev. Lett. 88 (2002) 097002
2. Lang K.M., Madhavan V., Hoffman J.E., Hudson E.W., Eisaki H., Uchida S., and Davis J.C. Nature 415 (2002) 412
3. Demsar J., Podobnik B., Kabanov V.V., Wolf Th., and Mihailovic D. Phys. Rev. Lett. 82 (1999) 4918
4. Misochko O.V., Georgiev N., Dekorsi T., and Helm M. Phys. Rev. Lett. 89 (2002) 067002
5. McQueeney R.J., Petrov Y., Egami T., Yethiraj M., Shirane G., and Endoh Y. Phys. Rev. Lett. 82 (1999) 628
6. Bozin E.S., Kwei G.H., Takagi H., and Billinge S.J.L. Phys. Rev. Lett. 84 (2000) 5856
7. Bianconi A., Saini N.L., Lanzara A., Missori M., Rossetti T., Oyanagi H., Yamaguchi H., Oka K., and Ito T. Phys. Rev. Lett. 76 (1996) 3412
8. Saini N.L., Lanzara A., Oyanagi H., Yamaguchi H., Oka K., Ito T., and Bianconi A. Phys. Rev. B 55 (1997) 12759
9. Lanzara A., Saini N.L., Bianconi A., Hazemann J.L., Soldo Y., Chou F.C., and Johnston D.C. Phys. Rev. B 55 (1997) 9120
10. Ovchinnikov Y.N., Wolf S.A., and Kresin V.Z. Phys. Rev. B 63 (2001) 064524
11. Holder A.B., Bishop A.R., Büttner H., Egami T., Micnas R., and Müller K.A. J. Phys. Condens. Matter 13 (2001) L545
12. Mihailovic D., Kabanov V.V., and Muller K.A. Eur. Phys. Lett. 57 (2002) 254
13. Tranquada J.M., Sternlieb B.J., Axe J.D., Nakamura Y., and Uchida S. Nature 375 (1995) 561
14. Temprano D.R., Mesot J., Janssen S., Conder K., Furrer A., Mutka H., and Müller K.A. Phys. Rev. Lett. 84 (2000) 1990
15. Mustre de Leon J., Acosta-Alejandro M., Conradson S.D., and Bishop A.R. J. Synchrotron Rad. 12 (2005) 193
16. Salkola M., Mustre de Leon J., Trugman S.A., and Bishop A.R. Phys. Rev. B 49 (1994) 3671
17. Chou F.C., and Johnston D.C. Phys. Rev. B 54 (1996) 572
18. Mustre de Leon J., Conradson S.D., Batistic I., Bishop A.R., Raistrick I.D., Aronson M.C., and Garzon F.H. Phys. Rev. B 45 (1992) 2447
19. Radaelli P.G., Jorgensen J.D., Schultz A.J., Hunter B.A., Wagner J.L., Chou F.C., and Johnston D.C. Phys. Rev. B 48 (1993) 499-510
20. Ankudinov A.L., Ravel B., Rehr J.J., and Conradson S.D. Phys. Rev. B 58 (1998) 7565
21. Di Cicco A., and Sperandini F. Physica C 258 (1996) 349
22. This estimation of uncertainties is commonly used when comparing measurements on the same sample, changing a single variable e.g., temperature, illumination, etc. A.V. Kolobov, H. Oyanagi, T. Tanaka, J. Phys. IV 7 (1997) c2-543; F.J. Espinosa, J. Mustre de Leon, S.D. Conradson, J.L. Peña, M. Zapata-Torres, Phys. Rev. Lett. 83 (1999) 3446.
23. Mihailovic D., and Kabanov V.V. Phys. Rev. B 63 (2001) 054505
24. Mustre de Leon J., Batistic I., Bishop A.R., Conradson S.D., and Trugman S.A. Phys. Rev. Lett. 68 (1992) 3236
25. Mustre de Leon J., Conradson S.D., Batistic I., and Bishop A.R. Phys. Rev. Lett. 65 (1990) 1675
26. Lanzara A., Bogdanov P.V., Zhou X.J., Kellar S.A., Feng D.L., Lu E.D., Yoshida T., Eisaki H., Fujimori A., Kishio K., Shimoyama J.I., Noda T., Uchida S., Hussain Z., and Shen Z.X. Nature (London) 412 (2001) 510
27. Saini N.L., Oyanagi H., Scagnoli V., Ito T., Oka K., and Bianconi A. Europhys. Lett. 63 (2003) 125