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Volumn , Issue , 2008, Pages 1-2
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CMOS technology after reaching the scale limit
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Author keywords
[No Author keywords available]
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Indexed keywords
CMOS TECHNOLOGIES;
DOWN-SCALING;
GA TE LENGTHS;
SCALING LIMITS;
TECHNOLOGY;
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EID: 50849142498
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/IWJT.2008.4540004 Document Type: Conference Paper |
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Times cited : (26)
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References (0)
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