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Volumn 104, Issue 4, 2008, Pages

Abnormal temperature-dependent stability of on-plastic a-Si:H thin film transistors fabricated at 150 °c

Author keywords

[No Author keywords available]

Indexed keywords

ABS RESINS; GATE DIELECTRICS; GATES (TRANSISTOR); LEAKAGE CURRENTS; PLASTICS; SEMICONDUCTING SILICON COMPOUNDS; SILICON; THICK FILMS; THIN FILMS; TRANSISTORS;

EID: 50849137809     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2969789     Document Type: Article
Times cited : (14)

References (26)
  • 16
    • 0035424162 scopus 로고    scopus 로고
    • 0018-9383 10.1109/16.936588, (), and references therein.
    • H. Gleskova and S. Wagner, IEEE Trans. Electron Devices 0018-9383 10.1109/16.936588 48, 1667 (2001), and references therein.
    • (2001) IEEE Trans. Electron Devices , vol.48 , pp. 1667
    • Gleskova, H.1    Wagner, S.2
  • 18
    • 21544438388 scopus 로고
    • 0003-6951 10.1063/1.94399.
    • M. J. Powell, Appl. Phys. Lett. 0003-6951 10.1063/1.94399 43, 597 (1983).
    • (1983) Appl. Phys. Lett. , vol.43 , pp. 597
    • Powell, M.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.