Atomic transition probabilities of silicon. A critical compilation

Journal of Physical and Chemical Reference Data

Volumn 37, Issue 3, 2008, Pages 1285-1501

  Kelleher, D E ^a   Podobedova, L I ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Atomic spectra; Energy levels; Ions; Line strengths; Oscillator strengths; Silicon; Transition probabilities; Uncertainties

Indexed keywords

ABSORPTION SPECTROSCOPY; ATOMIC SPECTROSCOPY; ELECTRON ENERGY LEVELS; IONS; SILICON; UNCERTAINTY ANALYSIS;

ATOMIC SPECTRA; LINE STRENGTH; OSCILLATOR STRENGTHS; TRANSITION PROBABILITIES; UNCERTAINTIES;

ATOMS;

EID: 50849120014     PISSN: 00472689     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2734566     Document Type: Article

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