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Volumn 44, Issue 9, 2008, Pages 927-931
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X-ray diffraction study of ternary layered compounds in the PbSe-Bi 2Se 3 system
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 50849114849
PISSN: 00201685
EISSN: 16083172
Source Type: Journal
DOI: 10.1134/S0020168508090057 Document Type: Article |
Times cited : (22)
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References (9)
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