XPS, EPMA and microstructural analysis of a defective industrial plasma-nitrided steel

Surface and Coatings Technology

Volumn 202, Issue 24, 2008, Pages 5887-5894

  Flori, M ^a   Gruzza, B ^b   Bideux, L ^b   Monier, G ^b   Robert Goumet, C ^b   Cherre J P ^c   de Baynast, H ^c  

^a POLITEHNICA UNIVERSITY OF TIMISOARA   (Romania)

^b UNIVERSITÉ BLAISE PASCAL   (France)

^c UNIVERSITÉ CLERMONT AUVERGNE   (France)

Author keywords

42CrMo4 steel; EPMA; Light microscopy; Microhardness measurements; Nitrogen profiles; Plasma nitriding; XPS

Indexed keywords

CHEMICAL PROPERTIES; CONCENTRATION (PROCESS); ELECTRON PROBE MICROANALYSIS; HARDNESS; MICROANALYSIS; MOLECULAR ORBITALS; MOLECULAR SPECTROSCOPY; NITROGEN; NONMETALS; PHOTOELECTRON SPECTROSCOPY; PLASMA APPLICATIONS; WATER POLLUTION;

42CRMO4 STEEL; CASE-DEPTH; DIFFERENT SCALES; EPMA; HARDNESS PROFILES; LIGHT MICROSCOPY; MICRO-HARDNESS MEASUREMENT; MICROHARDNESS MEASUREMENTS; MICROSTRUCTURAL ANALYSIS; NITRIDED STEELS; NITROGEN CONCENTRATIONS; NITROGEN PROFILES; PHYSICO-CHEMICAL PROPERTIES; PLASMA NITRIDING; STRUCTURE FEATURES; X-RAY PHOTOELECTRON SPECTROSCOPY XPS; XPS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 50849113740     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2008.06.164     Document Type: Article

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