Transmission X-ray microscopy (TXM) reveals the nanostructure of a smectite gel

Langmuir

Volumn 24, Issue 16, 2008, Pages 8954-8958

  Zbik, Marek S ^a   Martens, Wayde N ^a   Frost, Ray L ^a   Song, Yen Fang ^b   Chen, Yi Ming ^b   Chen, Jian Hua ^b  

^a QUEENSLAND UNIVERSITY OF TECHNOLOGY   (Australia)

^b NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

COLLOIDS; CONSTRUCTION INDUSTRY; CURING; GELATION; GELS; INTERCONNECTION NETWORKS; THREE DIMENSIONAL; X RAY MICROSCOPES;

SMECTITE; SMECTITES; X-RAY MICROSCOPY;

CLAY MINERALS;

NANOMATERIAL; SILICATE; SILICON DIOXIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; ELECTRON PROBE MICROANALYSIS; GEL; ULTRASTRUCTURE;

ELECTRON PROBE MICROANALYSIS; GELS; MICROSCOPY, ATOMIC FORCE; NANOSTRUCTURES; SILICATES;

EID: 50849106374     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la800986t     Document Type: Article

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