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1
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33845584665
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A Differential Cell Terminal Biasing Scheme Enabling A Stable Write Operation against a Large Random Threshold Voltage (Vth) Variation
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H.Yamauchi,T.Suzuki, Y.Yamagami,"A Differential Cell Terminal Biasing Scheme Enabling A Stable Write Operation against a Large Random Threshold Voltage (Vth) Variation" IEICE Transactions on Electronics., Vol.E89-C, No.11, pp.1526-1534 (2006)
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(2006)
IEICE Transactions on Electronics
, vol.E89-C
, Issue.11
, pp. 1526-1534
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Yamauchi, H.1
Suzuki, T.2
Yamagami, Y.3
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2
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34247107643
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A 1R/1W SRAM Cell Design to Keep Cell Current and Area Saving Against Simultaneous Read/Write Disturbed Accesses
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H.Yamauchi,T.Suzuki, Y.Yamagami," A 1R/1W SRAM Cell Design to Keep Cell Current and Area Saving Against Simultaneous Read/Write Disturbed Accesses" IEICE Transactions on Electronics., Vol. E90-C No.4, pp.1129-1137 (2007)
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(2007)
IEICE Transactions on Electronics
, vol.E90-C
, Issue.4
, pp. 1129-1137
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Yamauchi, H.1
Suzuki, T.2
Yamagami, Y.3
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3
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31344451652
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A 3-GHz 70-mb SRAM in 65-nm CMOS technology with integrated column-based dynamic power supply
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Jan
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K. Zhang; U.Bhattacharya, Z. Chen; F. Hamzaoglu, D.Murray, N.Vallepalli, Y.Wang; B. Zheng; M.Bohr, "A 3-GHz 70-mb SRAM in 65-nm CMOS technology with integrated column-based dynamic power supply", IEEE JSSC, Vol.41, No.1, pp.146-151, Jan, (2006)
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(2006)
IEEE JSSC
, vol.41
, Issue.1
, pp. 146-151
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Zhang, K.1
Bhattacharya, U.2
Chen, Z.3
Hamzaoglu, F.4
Murray, D.5
Vallepalli, N.6
Wang, Y.7
Zheng, B.8
Bohr, M.9
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5
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0031335506
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A 0.5V Single Power Supply Operated High-Speed Boosted and Offset-Grounded Data Storage (BOGS) SRAM Cell Architecture
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Dec
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H.Yamauchi, T. Iwata, H.Akamatsu, A.Matsuzawa "A 0.5V Single Power Supply Operated High-Speed Boosted and Offset-Grounded Data Storage (BOGS) SRAM Cell Architecture", IEEE Transaction on VLSI Systems Vol. 5, Issue 4, pp.377-387 Dec. (1997)
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(1997)
IEEE Transaction on VLSI Systems
, vol.5
, Issue.4
, pp. 377-387
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Yamauchi, H.1
Iwata, T.2
Akamatsu, H.3
Matsuzawa, A.4
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6
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39749175133
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A 65 nm SoC Embedded 6T-SRAM Design for Manufacturing with Read and Write Cell Stabilizing Circuits
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June
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S. Ohbayashi; M. Yabuuchi; K. Nii; Y. Tsukamoto; S. Imaoka; Y. Oda; M. Igarashi; M. Takeuchi; H. Kawashima; H. Makino; Y. Yamaguchi; K. Tsukamoto; M. Inuishi; K. Ishibashi; H. Shinohara, "A 65 nm SoC Embedded 6T-SRAM Design for Manufacturing with Read and Write Cell Stabilizing Circuits",IEEE Symposium on VLSI Circuits, 2-5, June, (2006)
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(2006)
IEEE Symposium on VLSI Circuits
, pp. 2-5
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Ohbayashi, S.1
Yabuuchi, M.2
Nii, K.3
Tsukamoto, Y.4
Imaoka, S.5
Oda, Y.6
Igarashi, M.7
Takeuchi, M.8
Kawashima, H.9
Makino, H.10
Yamaguchi, Y.11
Tsukamoto, K.12
Inuishi, M.13
Ishibashi, K.14
Shinohara, H.15
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7
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51049094640
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A 45nm Dual-Port SRAM with Write and Read Capability Enhancement at Low Voltage
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Sept
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D.PING Wang, H.J. Liao, H.Yamauchi, W.Hwang, Y. L. Lin, Y. H. Chen, H. C. Chang, "A 45nm Dual-Port SRAM with Write and Read Capability Enhancement at Low Voltage" IEEE International System on Chip Conference (SOCC), Sept. (2007)
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(2007)
IEEE International System on Chip Conference (SOCC)
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Wang, D.P.1
Liao, H.J.2
Yamauchi, H.3
Hwang, W.4
Lin, Y.L.5
Chen, Y.H.6
Chang, H.C.7
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