A low power deterministic test pattern generator for BIST based on cellular automata

Proceedings - 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008

Volumn , Issue , 2008, Pages 266-269

  Cao, Bei ^a   Xiao, Liyi ^a   Wang, Yongsheng ^a  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BENCHMARKING; BOOLEAN FUNCTIONS; CELLULAR AUTOMATA; COMBINATORIAL CIRCUITS; ELECTRIC POWER UTILIZATION; ELECTRONICS ENGINEERING; PATTERN RECOGNITION SYSTEMS; TECHNICAL PRESENTATIONS; TRANSLATION (LANGUAGES);

COMBINATIONAL CIRCUITS; INTERNATIONAL SYMPOSIUM; LOW POWERS; TEST PATTERNS;

TESTING;

EID: 50649125235     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DELTA.2008.65     Document Type: Conference Paper

References (7)

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