Monolithic germanium SWIR imaging array

2008 IEEE International Conference on Technologies for Homeland Security, HST'08

Volumn , Issue , 2008, Pages 577-582

  Rafferty, Conor ^a   King, Clifford ^a   Ackland, Bryan ^a   O'Neill, Jay ^a   Aberg, Ingvar ^a   Sriram, T S ^a   Mackay, Angus ^a   Johnson, Robert ^a  

^a NoblePeak Vision Corp   (United States)

Author keywords

Germanium; Imager; SWIR

Indexed keywords

CHARGE COUPLED DEVICES; COMPUTER NETWORKS; DISLOCATIONS (CRYSTALS); ELECTRON TUBES; GERMANIUM; IMAGE SENSORS; LANDFORMS; NONMETALS; OPTOELECTRONIC DEVICES; PHOTODIODES; REFLECTIVE COATINGS; SECURITY SYSTEMS; SILICON;

CMOS PROCESSING; HOME LAND SECURITY; IMAGER; SWIR;

SILICON WAFERS;

EID: 50649123260     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/THS.2008.4534517     Document Type: Conference Paper

References (4)

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2. United States Patent 7,012,314 Bude, King, Carroll, "Semiconductor devices with reduced active region defects and unique contacting schemes", issued Mar 14, 2006.
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4. D'Agostino, J.A., "A 3-D Noise Analysis Methodology", FLIR92 Thermal Imaging Systems Performance Model, 15-22 (1991).