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Volumn 468, Issue 15-20, 2008, Pages 1666-1669
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Structural characterization of multi-coated YBCO films processed by metal-organic deposition method
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Author keywords
Multi coating; TEM; TFA MOD; YBCO coated conductor
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Indexed keywords
CALCINATION;
CLADDING (COATING);
CRITICAL CURRENTS;
ION BEAM ASSISTED DEPOSITION;
METALS;
MICROSTRUCTURE;
OPTICAL DESIGN;
SUPERCONDUCTING FILMS;
YTTRIUM BARIUM COPPER OXIDES;
COATED FILMS;
CRITICAL PROPERTIES;
DIP COATINGS;
FILM-THICKNESS;
METAL-ORGANIC DEPOSITION;
MULTI-COATING;
PHASE FORMATIONS;
STRUCTURAL CHARACTERIZATIONS;
TEM;
TFA-MOD;
TFA-MOD PROCESS;
TRANSMISSION ELECTRON;
X-RAY DIFFRACTION;
YBCO COATED CONDUCTOR;
MOLECULAR BEAM EPITAXY;
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EID: 50649109816
PISSN: 09214534
EISSN: None
Source Type: Journal
DOI: 10.1016/j.physc.2008.05.170 Document Type: Article |
Times cited : (3)
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References (7)
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