CMOS image sensors: State-of-the-art

Solid-State Electronics

Volumn 52, Issue 9, 2008, Pages 1401-1406

  Theuwissen, Albert J P ^a,b  

^a Harvest Imaging   (Belgium)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COPYING; DIGITAL CAMERAS; DIGITAL IMAGE STORAGE; IMAGE SENSORS; IMAGING TECHNIQUES; SENSORS; SHRINKAGE;

CMOS IMAGE SENSORS; CMOS IMAGERS; CMOS TECHNOLOGIES; PERFORMANCE CHARACTERISTICS; PHYSICAL PARAMETERS; PIXEL ARCHITECTURES; PIXEL LEVEL; PIXEL SIZES;

PIXELS;

CAMERAS; IMAGE ANALYSIS; REPROGRAPHY; SENSORS; SHRINKAGE;

EID: 50649100660     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2008.04.012     Document Type: Article

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