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Volumn , Issue , 2006, Pages 541-544

Dielectric losses and breakdown in silicone gel

Author keywords

[No Author keywords available]

Indexed keywords

BREAKDOWN FIELDS; DIELECTRIC PHENOMENON; ELECTRICAL INSULATION;

EID: 50549105152     PISSN: 00849162     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CEIDP.2006.311989     Document Type: Conference Paper
Times cited : (20)

References (7)
  • 2
    • 0026882627 scopus 로고
    • The universal dielectric response and its physical significance
    • A. K. Jonscher, "The universal dielectric response and its physical significance", IEEE Trans. Electr. Insu!. 27, pp 407-23, 1992.
    • (1992) IEEE Trans. Electr. Insu , vol.27 , pp. 407-423
    • Jonscher, A.K.1
  • 4
    • 84979390172 scopus 로고
    • Dielectric relaxation spectroscopy in poly(hydroxyethylacrylates)/water hydrogels
    • A. Kyritsis, P. Pissis, J. Grammatikakis, Dielectric relaxation spectroscopy in poly(hydroxyethylacrylates)/water hydrogels, J. Polym. Sci. Polym. Phys. Ed. 33, pp. 1737-50, 1995.
    • (1995) J. Polym. Sci. Polym. Phys. Ed , vol.33 , pp. 1737-1750
    • Kyritsis, A.1    Pissis, P.2    Grammatikakis, J.3
  • 5
    • 0000334428 scopus 로고    scopus 로고
    • Electrical conductivity effects in polyethylene terephthalate films
    • E. Neagu, P. Pissis, L. Apekis, "Electrical conductivity effects in polyethylene terephthalate films", Journal of Applied Physics, Vol. 87, No. 6, 2000.
    • (2000) Journal of Applied Physics , vol.87 , Issue.6
    • Neagu, E.1    Pissis, P.2    Apekis, L.3
  • 7
    • 4444248889 scopus 로고
    • Le champ critique de claquage de films d'oxyde de poluphénylène réalisés par voie électrochimique
    • B. Adohi, J. P. Gosse, B. Gosse, "Le champ critique de claquage de films d'oxyde de poluphénylène réalisés par voie électrochimique", J. Phys. III France, 1, pp. 1623-1646, 1991.
    • (1991) J. Phys. III France , vol.1 , pp. 1623-1646
    • Adohi, B.1    Gosse, J.P.2    Gosse, B.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.