X-ray photoelectron and X-ray Auger electron spectroscopy studies of heavy ion irradiated C 60 films

Applied Surface Science

Volumn 254, Issue 22, 2008, Pages 7280-7284

  Kumar, Amit ^a   Singh, F ^b   Govind, ^c   Shivaprasad, S M ^c   Avasthi, D K ^b   Pivin, J C ^d  

^a LABORATOIRE DE CRISTALLOGRAPHIE   (France)

^b INTER UNIVERSITY ACCELERATOR CENTRE   (India)

^c NATIONAL PHYSICAL LABORATORY   (India)

^d 91405 Orsay Campus   (France)

Author keywords

Fullerene; Ion irradiation; X ray photoelectron spectroscopy; X ray induced Auger electron spectroscopy

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; AUGERS; FULLERENES; HEAVY IONS; ION BOMBARDMENT; PHOTOELECTRONS; PHOTONS;

C 1S CORE LEVEL; C60 FILMS; ION FLUENCES; POLYCRYSTALLINE FULLERENE; SHAKE-UP SATELLITE; SURFACE REGION; X-RAY INDUCED AUGER ELECTRON SPECTROSCOPIES; X-RAY PHOTOELECTRONS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 50549102655     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.05.322     Document Type: Article

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