Using static analysis to find bugs

IEEE Software

Volumn 25, Issue 5, 2008, Pages 22-29

  Ayewah, Nathaniel ^a   Hovemeyer, David ^b   Morgenthaler, David J ^c,d   Penix, John ^a,d   Pugh, William ^a  

^a UNIVERSITY OF MARYLAND   (United States)

^b YORK COLLEGE OF PENNSYLVANIA   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d GOOGLE INC   (United States)

Author keywords

Book reviews; Bug patterns; Code quality; Computer bugs; Detectors; FindBugs; Interviews; Java; Programming; Software; Software defects; Software quality; Static analysis

Indexed keywords

BOOK REVIEWS; BUG PATTERNS; CODE QUALITY; COMPUTER BUGS; DETECTORS; FINDBUGS; INTERVIEWS; JAVA; PROGRAMMING; SOFTWARE; SOFTWARE DEFECTS; SOFTWARE QUALITY;

STATIC ANALYSIS;

EID: 50549091105     PISSN: 07407459     EISSN: None     Source Type: Journal    
DOI: 10.1109/MS.2008.130     Document Type: Article

References (14)

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12. "Mondrian: Code Review on the Web," Dec. 2006, http://video.google.com/videoplay?docid=-8502904076440714866.
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14. JSR 305: Annotations for Software Defect Detection, http://jcp.org/en/jsr/detail?id=305.