Chiral photonic crystals with an anisotropic defect layer: Oblique incidence

Optics Communications

Volumn 281, Issue 20, 2008, Pages 5097-5103

  Gevorgyan, A H ^a  

^a YEREVAN STATE UNIVERSITY   (Armenia)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; CRYSTAL ATOMIC STRUCTURE; CRYSTALLOGRAPHY; CRYSTALS; DEFECTS; EMISSION SPECTROSCOPY; LIGHT REFLECTION; PHOTONICS; POWDERS; REFLECTION;

CENTRAL REGION; DEFECT LAYERS; DEFECT MODES; DENSITY OF PHOTONIC STATES; EMISSION PEAKING; INCIDENCE ANGLES; LASER DYES; LIGHT ENERGY; LIGHT INCIDENCE; OBLIQUE INCIDENCE; REFLECTION SPECTRUM; SELECTIVE REFLECTION;

PHOTONIC CRYSTALS;

EID: 50449102190     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2008.07.024     Document Type: Article

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