Effects of topography in nano-structured thin films: A Lorentz transmission electron microscopy and electron holography study

Reviews on Advanced Materials Science

Volumn 5, Issue 5, 2003, Pages 403-412

  De Hosson, Jeff Th M ^a   De Raedt, Hans A ^a  

^a UNIVERSITY OF GRONINGEN   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; ELECTRON HOLOGRAPHY; FILM PREPARATION; IRON ALLOYS; MAGNETIC THIN FILMS; MAGNETIZATION; MAGNETRON SPUTTERING; STATISTICAL METHODS; SURFACE ROUGHNESS; SURFACE STRUCTURE; THICKNESS MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY;

LORENTZ TRANSMISSION ELECTRON MICROSCOPY; MAGNETIC INDUCTION; MAGNETRON REACTIVE SPUTTERING; NANOSTRUCTURED THIN FILMS; SELECTED AREA DIFFRACTION; STATISTICAL DESCRIPTION; ULTRASOFT MAGNETIC FILMS;

NANOSTRUCTURED MATERIALS;

EID: 5044248212     PISSN: 16065131     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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