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Volumn 151, Issue 4, 2004, Pages 335-336
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Analogue and mixed-signal test for systems on chip
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Author keywords
[No Author keywords available]
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Indexed keywords
ANALOG TO DIGITAL CONVERSION;
AUTOMATIC TESTING;
BUILT-IN SELF TEST;
CMOS INTEGRATED CIRCUITS;
DESIGN FOR TESTABILITY;
DIGITAL CIRCUITS;
ELECTRIC CURRENT MEASUREMENT;
MICROELECTRONICS;
MULTIMEDIA SYSTEMS;
NANOTECHNOLOGY;
SIGNAL TO NOISE RATIO;
TELECOMMUNICATION SYSTEMS;
ANALOG CIRCUITS;
FAULT DIAGNOSIS;
MIXED SIGNAL TEST;
NANOELECTRONICS;
PROGRAMMABLE GAIN AMPLIFIERS;
SYSTEMS ON CHIP;
MICROPROCESSOR CHIPS;
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EID: 5044241399
PISSN: 13502409
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1049/ip-cds:20040924 Document Type: Editorial |
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Times cited : (4)
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References (0)
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