Backscattered SEM imaging of high-temperature samples for grain growth studies in metals

Institute of Physics Conference Series

Volumn 179, Issue , 2004, Pages 181-184

  Fielden, I M ^a   Cawley, J ^b   Rodenburg, J M ^c  

^a SHEFFIELD HALLAM UNIVERSITY   (United Kingdom)

^b Mappin Building ^*  (United Kingdom)

^c Solutio (Sheffield) Ltd   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; CRYSTAL ORIENTATION; GRAIN BOUNDARIES; GRAIN GROWTH; INFRARED RADIATION; MICROSTRUCTURE; PHASE TRANSITIONS; PHOTOMULTIPLIERS; SCANNING ELECTRON MICROSCOPY; STRENGTH OF MATERIALS;

CONVENTIONAL DIODE DETECTORS; ELECTRON IMAGING; ELECTRON-CHANNELLING CONTRAST (ECCI) GEOMETRY; PHOTOMULTIPLIER DETECTORS;

IMAGING TECHNIQUES;

EID: 5044238916     PISSN: 09513248     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)

1. Simkin B A Ben Simkin's Electron Channelling Contrast Imaging (ECCI) How-To [online] http://www.egr.msu.edu/~simkin/ECCI.html (last accessed 26708/03)
2. Reimer L 1998 Scanning Electron Microscopy: Physics of Image Formation and Microanalysis, 2nd ed (Heidelberg: Springer-Verlag)