THz Josephson properties of grain boundary YBaCuO junctions on symmetric, tilted bicrystal sapphire substrates

Journal of Applied Physics

Volumn 96, Issue 6, 2004, Pages 3357-3361

  Stepantsov, E ^a   Tarasov, M ^b   Kalabukhov, A ^c   Kuzmin, L ^c   Claeson, T ^c  

^a SHUBNIKOV INSTITUTE OF CRYSTALLOGRAPHY   (Russian Federation)

^b INSTITUTE OF RADIO ENGINEERING AND ELECTRONICS   (Russian Federation)

^c CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL LATTICES; CRYSTALLINE MATERIALS; ELECTRIC POTENTIAL; ELECTRON BEAM LITHOGRAPHY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GRAIN BOUNDARIES; HEAT RADIATION; JOSEPHSON JUNCTION DEVICES; MAGNETIC FIELD EFFECTS; NATURAL FREQUENCIES; PULSED LASER DEPOSITION; SAPPHIRE; THERMAL CONDUCTIVITY; ULTRAVIOLET RADIATION; X RAY DIFFRACTION ANALYSIS;

HIGH CRITICAL TEMPERATURE SUPERCONDUCTORS (HTS); SCANNING PROBE MICROSCOPE (SPM); TERAHERTZ (THZ) FREQUENCY; ULTRAVIOLET (UV) LITHOGRAPHY;

YTTRIUM COMPOUNDS;

EID: 5044226001     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1782273     Document Type: Article

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