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Volumn , Issue , 2006, Pages 3144-3148

Development of a FPGA-based SoC instrument for the characterization of high sensitivity QCM oscillator sensors

Author keywords

[No Author keywords available]

Indexed keywords

BIOELECTRIC PHENOMENA; DATA STORAGE EQUIPMENT; ELECTRONICS INDUSTRY; FIELD PROGRAMMABLE GATE ARRAYS (FPGA); INDUSTRIAL ELECTRONICS; INTEGRATED CIRCUITS; LAWS AND LEGISLATION; OXIDE MINERALS; PHOTORESISTS; PIPELINES; PROGRAMMABLE LOGIC CONTROLLERS; QUARTZ; QUARTZ CRYSTAL MICROBALANCES;

EID: 50249173553     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IECON.2006.347394     Document Type: Conference Paper
Times cited : (4)

References (8)
  • 3
    • 50249129042 scopus 로고    scopus 로고
    • IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology, Random Instabilities, IEEE Std. 1139-1999, July 1999
    • IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology - Random Instabilities, IEEE Std. 1139-1999, July 1999.
  • 4
    • 84951279351 scopus 로고
    • Verwendung von Schwingquarzen zur Wägung dünner Schichten und zur Mikrowägung
    • G. Sauerbrey, "Verwendung von Schwingquarzen zur Wägung dünner Schichten und zur Mikrowägung", Z Phys, vol. 155, pp. 206, 1959.
    • (1959) Z Phys , vol.155 , pp. 206
    • Sauerbrey, G.1
  • 5
    • 36449008243 scopus 로고
    • Characterization of a thickness-shear mode quartz resonator with multiple nonpiezoelectric layers
    • V.E. Granstaff and S.J. Martin, "Characterization of a thickness-shear mode quartz resonator with multiple nonpiezoelectric layers", J. Appl. Phys., vol. 75, no. 3, pp. 1319-1329, 1994.
    • (1994) J. Appl. Phys , vol.75 , Issue.3 , pp. 1319-1329
    • Granstaff, V.E.1    Martin, S.J.2
  • 6
    • 0025468477 scopus 로고
    • An Allan Variance Real-Time Processing System for Frequency Stability Measurements of Semiconductor Lasers
    • Aug
    • K. Kuboki, and M. Ohtsu, "An Allan Variance Real-Time Processing System for Frequency Stability Measurements of Semiconductor Lasers", IEEE Transactions on Instrumentation and Measurement, vol. 39, no. 4, pp. 637-641, Aug. 1990.
    • (1990) IEEE Transactions on Instrumentation and Measurement , vol.39 , Issue.4 , pp. 637-641
    • Kuboki, K.1    Ohtsu, M.2
  • 8
    • 30344436225 scopus 로고    scopus 로고
    • Xilinx Corp. Available at
    • Virtex-4 Family Overview. Xilinx Corp. Available at: http://direct.xilinx.com/bvdocs/publications/ds112.pdf.
    • Virtex-4 Family Overview


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.