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Volumn , Issue , 2006, Pages 250-255

A novel detection method for voltage sags

Author keywords

Missing voltage; Peak value; RMS; Voltage sag

Indexed keywords

AND RECOVERY; DETECTION METHODS; DETECTION TIME; EVALUATION METHODS; GRID VOLTAGE; INSTANTANEOUS VALUE; INTERNATIONAL CONFERENCES; MISSING VOLTAGE; PEAK VALUE; POWER ELECTRONICS SYSTEMS; RMS; RMS METHOD; RMS VALUES; SAG ANALYSIS; SIMULATION RESULTS; VALUE METHODS; VOLTAGE SAG; VOLTAGE SAGS;

EID: 50249169235     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PESA.2006.343108     Document Type: Conference Paper
Times cited : (50)

References (8)
  • 1
    • 50249149362 scopus 로고    scopus 로고
    • http://www.powerstandards.com/.
    • "http://www.powerstandards.com/."
  • 2
    • 0042234152 scopus 로고    scopus 로고
    • Dynamic Voltage Sag Correction,
    • U. S. Patent 6 118 676, Sep
    • D. M. Divan, "Dynamic Voltage Sag Correction," U. S. Patent 6 118 676, Sep. 2000.
    • (2000)
    • Divan, D.M.1
  • 3
    • 50249109939 scopus 로고    scopus 로고
    • http://www.f47testing.com/.
    • "http://www.f47testing.com/."
  • 4
    • 50249121790 scopus 로고    scopus 로고
    • SEMI F47-0200 Specification For Semiconductor Processing Equipment Voltage Sag Immunity.
    • SEMI F47-0200 Specification For Semiconductor Processing Equipment Voltage Sag Immunity.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.