Experimental comparison between a portable DSPI device with diffractive optical element and a hole drilling strain gage combined system

Optics and Lasers in Engineering

Volumn 46, Issue 11, 2008, Pages 835-841

  Viotti, Matias R ^a   Albertazzi Jr , Armando G ^a   Kapp, Walter ^a  

^a FEDERAL UNIVERSITY OF SANTA CATARINA   (Brazil)

Author keywords

Diffractive optical element; DSPI; ESPI; Hole drilling; Radial in plane sensitivity; Residual stress measurements

Indexed keywords

DENSITY (OPTICAL); DRILLING; DRILLING PLATFORMS; GAGES; OPTICAL DEVICES; OPTICAL PROPERTIES; PORTABLE EQUIPMENT; RESIDUAL STRESSES; STRAIN GAGES; STRENGTH OF MATERIALS; STRESSES; YIELD STRESS;

COMBINED SYSTEMS; DIFFRACTIVE OPTICAL ELEMENT; DIFFRACTIVE OPTICAL ELEMENT (DOE); DIGITAL SPECKLE PATTERN INTERFEROMETRY; DOUBLE ILLUMINATION; DSPI; ESPI; EXPERIMENTAL COMPARISON; GRATING PERIODS; HOLE-DRILLING; ILLUMINATION SOURCES; IN-PLANE; OPTICAL BENCHES; OPTICAL ELEMENTS; PORTABLE DEVICES; RADIAL IN-PLANE SENSITIVITY; RESIDUAL STRESS FIELDS; RESIDUAL STRESS MEASUREMENTS; STRESS LEVELS;

DIFFRACTIVE OPTICAL ELEMENTS;

EID: 50249166548     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optlaseng.2008.05.020     Document Type: Article

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