Investigation of nanowire size dependency on TSNWFET

Technical Digest - International Electron Devices Meeting, IEDM

Volumn , Issue , 2007, Pages 891-894

  Sung, Dae Suk ^a   Li, Ming ^a   Yun, Young Yeoh ^a   Kyoung, Hwan Yeo ^a   Keun, Hwi Cho ^a   In, Kyung Ku ^a   Cho, Hong ^a   Jang, WonJun ^a   Kim, Dong Won ^a   Park, Donggun ^a   Lee, Won Seong ^a  

^a SAMSUNG Electronics   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC WIRE; ELECTRON DEVICES; NANOSTRUCTURED MATERIALS; NANOWIRES;

SIZE DEPENDENCY;

NANOSTRUCTURES;

EID: 50249161949     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.2007.4419093     Document Type: Conference Paper

References (5)

1. S. D. Suk et al., IEDM Tech Dig., p. 717, 2005.
2. N.Singh et al, IEDM Tech Dig., p. 547, 2006.
3. S. D. Suk et al. VLSI Tech Symp., p. 142, 2007.
4. A. Khakifirooz et al., IEDM Tech Dig., p. 667, 2006.
5. G. Tsutsui et al., IEDM Tech Dig., p. 747, 2005.