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Volumn , Issue , 2007, Pages

The effect of SnxAgCu and SnAgCuX on the mechanical drop performance in lead free CSP package

Author keywords

[No Author keywords available]

Indexed keywords

ARSENIC COMPOUNDS; BRAZING; CHEMICAL ENGINEERING; CHLORINE COMPOUNDS; COMPUTER OPERATING PROCEDURES; CONSUMER PRODUCTS; COPPER; DROPS; ELECTRIC CURRENTS; ELECTRONICS INDUSTRY; ELECTRONICS PACKAGING; FLUID MECHANICS; INTERMETALLICS; METALS; ORES; PRODUCT DEVELOPMENT; RELIABILITY; RESINS; SEMICONDUCTING INTERMETALLICS; SILVER; SOLDERING; TECHNOLOGY; TESTING; THERMAL AGING; VEHICLES; WELDING;

EID: 50249149435     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICEPT.2007.4441434     Document Type: Conference Paper
Times cited : (1)

References (11)
  • 4
    • 2942740958 scopus 로고    scopus 로고
    • Impact life prediction modeling of TFBGA packages under board level drop test
    • Tee TY, Ng HS, Lim CT, Pek E, Zhong Z (2004). Impact life prediction modeling of TFBGA packages under board level drop test. Microelectr. Reliab., 44(7): 1131-1142.
    • (2004) Microelectr. Reliab , vol.44 , Issue.7 , pp. 1131-1142
    • Tee, T.Y.1    Ng, H.S.2    Lim, C.T.3    Pek, E.4    Zhong, Z.5
  • 7
    • 33845574127 scopus 로고    scopus 로고
    • th Electr. Pack. Technol. Conf., Singapore, 2005, pp. 255-261.
    • th Electr. Pack. Technol. Conf., Singapore, 2005, pp. 255-261.
  • 11
    • 50249151278 scopus 로고    scopus 로고
    • th IPC/JEDEC international lead free conference, Singapore, Aug. 18-20, 2004.
    • th IPC/JEDEC international lead free conference, Singapore, Aug. 18-20, 2004.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.