Field emission observation of carbon nanosheet thin film by photoelectron emission microscopy (PEEM)

Technical Digest of the 20th International Vacuum Nanoelectronics Conference, IVNC 07

Volumn , Issue , 2007, Pages 129-130

  Hou, Kun ^a   Kordesch, Martin E ^b   Arp, Uwe ^c   Zhu, Mingyao ^a   Outlaw, Ronald A ^a   Miraldo, Peter ^a   Holloway, Brian C ^a,d   Manos, Dennis ^a  

^a The College of William and Mary   (United States)

^b OHIO UNIVERSITY   (United States)

^c NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^d LUNA INNOVATIONS INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 50249149407     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IVNC.2007.4480963     Document Type: Conference Paper

References (6)

1. J. J. Wang et al, Applied Physics Letters 85, 1265-1267(2004).
2. J. Wang et al, Carbon 42, 2867-2872(2004).
3. M. Zhu et al, Diamond and Related Materials 16, 196-201(2007).
4. S. Wang et al, Applied Physics Letters 89, 183103-183103(2006).
5. J. Wang et al, Journal of Vacuum Science & Technology B 22, 1269-1272(2004).
6. T. Tyler et al, Journal of Vacuum Science & Technology B 24, 2295-2301(2006).