Electron microscopy for chemists

Chemical and Engineering News

Volumn 86, Issue 25, 2008, Pages 31-34

  Jacoby, Mitch ^a  

^a C and EN Chicago ^*

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Indexed keywords

EID: 50249125384     PISSN: 00092347     EISSN: 1520605X     Source Type: Trade Journal    
DOI: 10.1021/cen-v086n025.p031     Document Type: Article

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