Improving supply chain visibility through RFID data

Proceedings - International Conference on Data Engineering

Volumn , Issue , 2008, Pages 102-103

  Melski, Adam ^a   Müller, Jürgen ^b   Zeier, Alexander ^b   Schumann, Matthias ^a  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

^b UNIVERSITY OF POTSDAM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL PROPERTIES; SUPPLY CHAIN MANAGEMENT; TECHNOLOGY; VISIBILITY;

DATA ENGINEERING; INTERNATIONAL CONFERENCES; RFID TECHNOLOGY; SUPPLY CHAIN VISIBILITY;

SUPPLY CHAINS;

EID: 50249109611     PISSN: 10844627     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICDEW.2008.4498295     Document Type: Conference Paper

References (7)

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3. T. Wailgum, "Tag, You're Late. Why Wal-Mart's suppliers won't make the Jan. 1 deadline for RFID tagging", CIO Magazine, Nov. 15, 2004.
4. S. Cohen and J. Roussel, Strategic Supply Chain Management: The Five Disciplines for Top Performance, New York: McGraw-Hill Professional, 2004.
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