Embedded flash on 90nm logic technology & beyond for FPGAs

Technical Digest - International Electron Devices Meeting, IEDM

Volumn , Issue , 2007, Pages 677-680

  Kojima, H ^a   Ema, T ^b   Anezaki, T ^a   Ariyoshi, J ^a   Ogawa, H ^a   Yoshizawa, K ^a   Mehta, S ^c   Fong, S ^c   Logie, S ^c   Smoak, R ^d   Rutledge, D ^d  

^a FUJITSU LABORATORIES LTD   (Japan)

^b Lattice Semiconductor Corporation ^*  (Japan)

^c Lattice Semiconductor Corporation   (United States)

^d Lattice Semiconductor   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; ELECTRON DEVICES; FIELD PROGRAMMABLE GATE ARRAYS (FPGA); FLASH MEMORY;

EMBEDDED FLASH; EMBEDDED FLASH TECHNOLOGY; EMBEDDED TECHNOLOGY; LEADING EDGES; LOGIC TECHNOLOGY; MEMORY CELLS; PROCESS STEPS; STACKED GATE;

TECHNOLOGY;

EID: 50249096747     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.2007.4419036     Document Type: Conference Paper

References (2)

1. Raszka,J et al., ISSCC 2004 Tech. Digest pp46-512 Vol.1
2. Isobe, K et al., IEDM 2001 Tech. Digest of 32.5.1-32.5.4