Trend of international safety standards

Proceedings of the SICE Annual Conference

Volumn , Issue , 2007, Pages 2901-2905

  Amanuma, Kotaro ^a  

^a Yamatake Corporation

Author keywords

EC; Education; ETPIS; IEC; ISO; NECA; Safety standard; Supply chain; Traceability; Ubiquitous

Indexed keywords

ANNUAL CONFERENCE; CONTROL ENGINEERS; EC; EDUCATION; ELECTRIC CONTROL; EQUIPMENT INDUSTRIES; ETPIS; IEC; INTERNATIONAL SAFETY STANDARDS; INTERNATIONAL STANDARDS; ISO; NECA; SAFETY STANDARD; SAFETY STANDARDS; SUPPLY CHAIN; TRACEABILITY; UBIQUITOUS;

CONTROL EQUIPMENT; SECURITY SYSTEMS; STANDARDS;

ELECTRIC CONTROL EQUIPMENT;

EID: 50249089612     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SICE.2007.4421485     Document Type: Conference Paper

References (16)

1. Project report of NECA, 2007.March
2. High-Level Group Report EC, 2004.Nov.
3. ETPIS Report, 2006.Jan.
4. Global standard and national strategy, Ken Sakamura 2005.10.30 NTT publishing
5. TRONWARE VOL.102
6. Revision of IEC61508, NECA meeting 2006.Jun.30 Ron Bell
7. JEMIMA NEWS RELEASE 2007.Jul. 15
8. INSTRUMENTATION ENGINEERING 2OO7.Vol.50 No.7 P37-P41 Kazuya Okada IDEC
9. Trend of IEC Functional Safety Standard revision SFF requirements, Yoshinobu Sato Tokyo University of Marine Science and Technology
10. rd R&D project of Standard & Certification of NECA Standard for management of control products in supply chain, Kotaro Amanuma YAMATAKE Corp.
11. Basic concept of safety design, Masao Mukaidono 2007.5.21 Japan Standard Association
12. Threat and countermeasure of embedded software device, research report of security map 2007.May 3-1 INFORMATION-TECHNOLOGY PROMOTIOM AGENCY JAPAN
13. Proceedings, International conference on Safety of Industrial Automated Systems, SIAS2005
14. Security technology map on threats & countermeasure of embedded software, Research report, INFORMATION -TECHNOLOGY PROMOTION AGENCY, 2007.May
15. st edition
16. IEC TS 61915 Low-voltage switchgear and control gear -Principles for the development of device profiles for networked industrial devices