Study of film growth properties of self-assembled polyelectrolyte films of higher thickness: Reflectometric and focused ion beam analyses

Journal of Physical Chemistry C

Volumn 112, Issue 28, 2008, Pages 10531-10537

  Dejeu, J ^a   Membrey, F ^a   Diziain, S ^b   Bainier, C ^b   Spajer, M ^b   Charraut, D ^b   Foissy, A ^a  

^a Faculté des Sciences et des Techniques La Bouloie   (France)

^b FEMTO ST INSTITUTE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BEAM PLASMA INTERACTIONS; ELECTRONICS INDUSTRY; FILM GROWTH; FOCUSED ION BEAMS; ION BEAMS; ION BOMBARDMENT; LIGHT REFRACTION; OPTICAL PROPERTIES; ORGANIC POLYMERS; POLYELECTROLYTES; POLYMER FILMS; POLYMERS; REFRACTIVE INDEX; REFRACTOMETERS; SILICA; SILICATE MINERALS; SILICON COMPOUNDS; STYRENE; THICK FILMS; WATER POLLUTION;

ABSOLUTE VALUES; ALLYL AMINES; BI-LAYERS; CHANGE OF REFRACTIVE INDEX; FIB MEASUREMENTS; FILM COMPOSITIONS; FOCUSED-ION-BEAM TECHNIQUE; GROWTH PROPERTIES; IN-SITU; INCIDENT BEAMS; LASER REFLECTOMETRY; NEGATIVE VALUES; POLYELECTROLYTE FILMS; POLYSTYRENE SULFONATES; SELF-ASSEMBLED; SILICA SUBSTRATES; SIMULATED DATA; THICKNESS OF THE FILM;

MOLECULAR BEAM EPITAXY;

EID: 50249086875     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp802457x     Document Type: Article

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