-
1
-
-
27144450557
-
Non-destructive characterisation of the CoTSPc deposition on gold electrodes by means of synchrotron X-ray fluorescence
-
Peeters K., De Wael K., Adriaens A., Falkenberg G., and Vincze L. Non-destructive characterisation of the CoTSPc deposition on gold electrodes by means of synchrotron X-ray fluorescence. Electrochemistry Communications 7 (2005) 1157-1162
-
(2005)
Electrochemistry Communications
, vol.7
, pp. 1157-1162
-
-
Peeters, K.1
De Wael, K.2
Adriaens, A.3
Falkenberg, G.4
Vincze, L.5
-
2
-
-
24644484064
-
Comparison of different surface modification techniques for electrodes by means of electrochemistry and micro synchrotron radiation X-ray fluorescence. Dimerization of cobalt(II) tetrasulfonated phthalocyanine and its influence on the electrodeposition on gold surfaces
-
Peeters K., De Wael K., Vincze L., and Adriaens A. Comparison of different surface modification techniques for electrodes by means of electrochemistry and micro synchrotron radiation X-ray fluorescence. Dimerization of cobalt(II) tetrasulfonated phthalocyanine and its influence on the electrodeposition on gold surfaces. Analytical Chemistry 77 17 (2005) 5512-5519
-
(2005)
Analytical Chemistry
, vol.77
, Issue.17
, pp. 5512-5519
-
-
Peeters, K.1
De Wael, K.2
Vincze, L.3
Adriaens, A.4
-
3
-
-
34250901733
-
Quantitative synchrotron micro-XRF study of CoTSPc and CuTSPc thin-films deposited on gold by electrodeposition
-
Peeters K., De Wael K., Adriaens A., Falkenberg G., and Vincze L. Quantitative synchrotron micro-XRF study of CoTSPc and CuTSPc thin-films deposited on gold by electrodeposition. Journal of Atomic Analytical Spectroscopy 22 5 (2007) 493-501
-
(2007)
Journal of Atomic Analytical Spectroscopy
, vol.22
, Issue.5
, pp. 493-501
-
-
Peeters, K.1
De Wael, K.2
Adriaens, A.3
Falkenberg, G.4
Vincze, L.5
-
4
-
-
0023297919
-
Chemically modified electrodes - molecular design for electroanalysis
-
Murray R.W., Ewing A.G., and Durst R. Chemically modified electrodes - molecular design for electroanalysis. Anal. Chem. 59 5 (1987) 379-390
-
(1987)
Anal. Chem.
, vol.59
, Issue.5
, pp. 379-390
-
-
Murray, R.W.1
Ewing, A.G.2
Durst, R.3
-
5
-
-
84987515833
-
Modified electrodes for electrochemical sensors
-
Wang J. Modified electrodes for electrochemical sensors. Electroanalysis 3 4-5 (1991) 469-471
-
(1991)
Electroanalysis
, vol.3
, Issue.4-5
, pp. 469-471
-
-
Wang, J.1
-
6
-
-
0028093219
-
Tutorial review. Voltammetric determination of trace metals and organics after accumulation at modified electrodes
-
Arrigan D.W.M. Tutorial review. Voltammetric determination of trace metals and organics after accumulation at modified electrodes. Analyst 199 (1994) 1953-1966
-
(1994)
Analyst
, vol.199
, pp. 1953-1966
-
-
Arrigan, D.W.M.1
-
7
-
-
33746652284
-
Quantification in XRF analysis of intermediate thickness samples
-
Van Grieken R., and Marcowicz A.A. (Eds), Marcel Dekker Inc, New York
-
Marckowicz A.A., and Van Grieken R. Quantification in XRF analysis of intermediate thickness samples. In: Van Grieken R., and Marcowicz A.A. (Eds). Handbook of X-ray Spectrometry (2001), Marcel Dekker Inc, New York 407-431
-
(2001)
Handbook of X-ray Spectrometry
, pp. 407-431
-
-
Marckowicz, A.A.1
Van Grieken, R.2
-
9
-
-
84990658473
-
Analysis of X-ray spectra by iterative least-squares (AXIL) - new developments
-
Vekemans B., Janssens K., Vincze L., Adams F., and Van Espen P. Analysis of X-ray spectra by iterative least-squares (AXIL) - new developments. X-ray Spectrom. 23 (1994) 278-285
-
(1994)
X-ray Spectrom.
, vol.23
, pp. 278-285
-
-
Vekemans, B.1
Janssens, K.2
Vincze, L.3
Adams, F.4
Van Espen, P.5
-
10
-
-
0003601534
-
-
Merck Research Laboratories, Whitehouse Station, New Jersey
-
The Merck Index. 12th Edition (1996), Merck Research Laboratories, Whitehouse Station, New Jersey
-
(1996)
The Merck Index. 12th Edition
-
-
-
11
-
-
5444276522
-
A library for X-ray-matter interaction cross section for X-ray fluorescence applications
-
Brunetti A., Sanchez del Rio M., Golosio B., Simionovici A., and Somogyi A. A library for X-ray-matter interaction cross section for X-ray fluorescence applications. Spectrochim. Acta Part B 59 (2004) 1725-1731
-
(2004)
Spectrochim. Acta Part B
, vol.59
, pp. 1725-1731
-
-
Brunetti, A.1
Sanchez del Rio, M.2
Golosio, B.3
Simionovici, A.4
Somogyi, A.5
-
12
-
-
0033683463
-
The use of synchrotron micro-XRF for characterization of the micro-heterogeneity of heavy metals in low-Z reference materials
-
Kempenaers L., Vincze L., and Janssens K. The use of synchrotron micro-XRF for characterization of the micro-heterogeneity of heavy metals in low-Z reference materials. Spectrochim. Acta Part B 55 (2000) 651-669
-
(2000)
Spectrochim. Acta Part B
, vol.55
, pp. 651-669
-
-
Kempenaers, L.1
Vincze, L.2
Janssens, K.3
-
13
-
-
0036787733
-
A Monte Carlo model for studying the microheterogeneity of trace elements in reference materials by means of synchrotron microscopic X-ray fluorescence
-
Kempenaers L., Janssens K., Vincze L., Vekemans B., Somogyi A., Drakopolous M., Simionivici A., and Adams F. A Monte Carlo model for studying the microheterogeneity of trace elements in reference materials by means of synchrotron microscopic X-ray fluorescence. Anal. Chem. 74 19 (2002) 5017-5026
-
(2002)
Anal. Chem.
, vol.74
, Issue.19
, pp. 5017-5026
-
-
Kempenaers, L.1
Janssens, K.2
Vincze, L.3
Vekemans, B.4
Somogyi, A.5
Drakopolous, M.6
Simionivici, A.7
Adams, F.8
|