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Volumn , Issue , 2008, Pages 35-40

Applying evolving fuzzy models with adaptive local error bars to on-line fault detection

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC MEASURING INSTRUMENTS; ELECTRONIC EQUIPMENT TESTING; ERROR DETECTION; FUZZY LOGIC; FUZZY SYSTEMS; PHOTOMASKS;

EID: 50149110194     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/GEFS.2008.4484564     Document Type: Conference Paper
Times cited : (19)

References (22)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.