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Volumn , Issue , 2007, Pages 827-832

Using Newton-Raphson method to estimate the condition of aluminum electrolytic capacitors

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ALUMINUM; CAPACITANCE; CAPACITORS; DIELECTRIC DEVICES; ELECTRIC EQUIPMENT; ELECTRONICS INDUSTRY; ELECTROSLAG REMELTING; ENERGY STORAGE; ESTIMATION; INDUSTRIAL ELECTRONICS; LIGHT METALS; NEWTON-RAPHSON METHOD; PAPER CAPACITORS; TECHNICAL PRESENTATIONS;

EID: 50049135473     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISIE.2007.4374704     Document Type: Conference Paper
Times cited : (38)

References (12)
  • 1
    • 50049115430 scopus 로고    scopus 로고
    • Technical notes CAT.8101D, Nichicon Corporation.
    • Technical notes CAT.8101D, Nichicon Corporation.
  • 2
    • 50049112013 scopus 로고    scopus 로고
    • Application Guide, Aluminum Electrolytic Capacitors, Cornell Dubilier, pp. 2.1832-2.202.
    • Application Guide, Aluminum Electrolytic Capacitors, Cornell Dubilier, pp. 2.1832-2.202.
  • 3
    • 0030394978 scopus 로고    scopus 로고
    • M. Gasperi, Life Prediction Model for Aluminum Electrolytic Capacitors, IAS'96, October, 1996, pp 1347-1351.
    • M. Gasperi, "Life Prediction Model for Aluminum Electrolytic Capacitors", IAS'96, October, 1996, pp 1347-1351.
  • 4
    • 0036754081 scopus 로고    scopus 로고
    • The Service Life of Large Aluminum Electrolytic Capacitors: Effects of Construction and Application
    • September/October
    • J. Stevens, J. Shaffer, J. Vandenham, "The Service Life of Large Aluminum Electrolytic Capacitors: Effects of Construction and Application", IEEE Transaction on Industry Applications, Vol. 38, no 5, September/October 2002, pp 1441-1446.
    • (2002) IEEE Transaction on Industry Applications , vol.38 , Issue.5 , pp. 1441-1446
    • Stevens, J.1    Shaffer, J.2    Vandenham, J.3
  • 6
    • 33745886857 scopus 로고    scopus 로고
    • Electrolytic Capacitor Failure of LC filter for switching-mode power Converters
    • 2, 6 October
    • Y. Chen, M. Chou, H. Wu, "Electrolytic Capacitor Failure of LC filter for switching-mode power Converters", IEEE Industry Applications Conference, 2 - 6 October, 2005, pp. 1464 - 1469.
    • (2005) IEEE Industry Applications Conference , pp. 1464-1469
    • Chen, Y.1    Chou, M.2    Wu, H.3
  • 8
    • 0032203504 scopus 로고    scopus 로고
    • Failure prediction of electrolytic capacitors during operation of a switch mode power supply
    • A. Lahyani, P. Venet, G. Grellet, P. Viverge, "Failure prediction of electrolytic capacitors during operation of a switch mode power supply", IEEE Transaction on Power Electronics, no 6, pp. 1199 - 1207, 1998.
    • (1998) IEEE Transaction on Power Electronics , Issue.6 , pp. 1199-1207
    • Lahyani, A.1    Venet, P.2    Grellet, G.3    Viverge, P.4
  • 9
    • 0031364227 scopus 로고    scopus 로고
    • A method for predicting the expected life of bus capacitors
    • 5, 9 October
    • M. Gaspari, "A method for predicting the expected life of bus capacitors", IEEE Industry Applications Conference, 5 - 9 October, 1997, pp. 1042 - 1047.
    • (1997) IEEE Industry Applications Conference , pp. 1042-1047
    • Gaspari, M.1
  • 11
    • 0141866832 scopus 로고    scopus 로고
    • Improved Spice Model of Aluminum Electrolytic Capacitors for Inverter Applications
    • July
    • S. Parter, "Improved Spice Model of Aluminum Electrolytic Capacitors for Inverter Applications", IEEE Transactions on Industry Applications, Vol. 39, No 4, pp. 929-935, July 2003.
    • (2003) IEEE Transactions on Industry Applications , vol.39 , Issue.4 , pp. 929-935
    • Parter, S.1
  • 12
    • 36049001791 scopus 로고    scopus 로고
    • An Experimental Technique for Estimating the ESR and Reactance Intrinsic Values of Aluminum Electrolytic Capacitors
    • Sorrento, Italy, 24-27 April
    • A. Amaral, A. Cardoso, "An Experimental Technique for Estimating the ESR and Reactance Intrinsic Values of Aluminum Electrolytic Capacitors", Proceedings of IEEE Instrumentation and Measurement Technology Conference, Sorrento, Italy, 24-27 April, 2006.
    • (2006) Proceedings of IEEE Instrumentation and Measurement Technology Conference
    • Amaral, A.1    Cardoso, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.