Gray level topological corner detection

IEEE International Symposium on Industrial Electronics

Volumn , Issue , 2007, Pages 1727-1730

  Cihan, Ibrahim Kivanç ^a   Şenel, Hakan Güray ^b  

^a Havelsan AS   (Turkey)

^b ANADOLU UNIVERSITY   (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

INDUSTRIAL ELECTRONICS; TECHNICAL PRESENTATIONS; TOPOLOGY;

CORNER DETECTION; GRAY LEVELS; GRAY-LEVEL IMAGES; INTERNATIONAL SYMPOSIUM; MEDIAN FILTERING; STRUCTURING ELEMENT;

ELECTRONICS INDUSTRY;

EID: 50049131849     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISIE.2007.4374865     Document Type: Conference Paper

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