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Volumn , Issue , 2007, Pages 401-406

On the maximum permissible working voltage of commercial power silicon diodes and thyristors

Author keywords

[No Author keywords available]

Indexed keywords

AVALANCHES (SNOWSLIDES); CURRENT VOLTAGE CHARACTERISTICS; DIODES; ELECTRIC RECTIFIERS; ELECTRIC SWITCHGEAR; ELECTRONICS INDUSTRY; INDUSTRIAL ELECTRONICS; LEAKAGE CURRENTS; NONMETALS; OCCUPATIONAL RISKS; SEMICONDUCTING SILICON COMPOUNDS; SILICON; SNOW; TECHNICAL PRESENTATIONS; THYRISTORS;

EID: 50049131197     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISIE.2007.4374631     Document Type: Conference Paper
Times cited : (1)

References (8)
  • 1
    • 0016988314 scopus 로고
    • The theory and application of a simple etch contour for near ideal breakdown voltage in plane and planar PN junctions
    • V.A.K Temple and M.S. Adler, "The theory and application of a simple etch contour for near ideal breakdown voltage in plane and planar PN junctions", IEEE Trans. Electron Devices, vol. ED-23, No.8, 1976, pp. 950-955
    • (1976) IEEE Trans. Electron Devices , vol.ED-23 , Issue.8 , pp. 950-955
    • Temple, V.A.K.1    Adler, M.S.2
  • 2
    • 0021482599 scopus 로고
    • Breakdown voltage optimization of p planar junction diodes
    • H. Kyuwoon, and D.H. Navon, "Breakdown voltage optimization of p planar junction diodes", IEEE Trans. Electron Devices, vol. ED-31, No.9, 1984, pp.1126-1135
    • (1984) IEEE Trans. Electron Devices , vol.ED-31 , Issue.9 , pp. 1126-1135
    • Kyuwoon, H.1    Navon, D.H.2
  • 3
    • 0035158795 scopus 로고    scopus 로고
    • Voltage handling capabilities and termination techniques of silicon power semiconductor devices
    • Minneapolis, MN, USA
    • G. Charitat, "Voltage handling capabilities and termination techniques of silicon power semiconductor devices", in Proceedings of the 2001 Bipolar/biCMOS Circuits and Technology Meeting, Minneapolis, MN, USA, 2001, pp. 175-183
    • (2001) Proceedings of the 2001 Bipolar/biCMOS Circuits and Technology Meeting , pp. 175-183
    • Charitat, G.1
  • 4
    • 0038309708 scopus 로고
    • Transient voltage suppressor types and application
    • O. M. Clark, "Transient voltage suppressor types and application", IEEE Trans. Power Electronics, vol. 5, 1990, pp. 20-26
    • (1990) IEEE Trans. Power Electronics , vol.5 , pp. 20-26
    • Clark, O.M.1
  • 6
    • 50049101377 scopus 로고    scopus 로고
    • On the reliability of power silicon rectifier diodes above the maximum permissible operation junction temperature
    • Montreal, Canada
    • V.V.N. Obreja, "On the reliability of power silicon rectifier diodes above the maximum permissible operation junction temperature" Proceedings 2006 International Symposium on Industrial Electronics (ISIE2006), Montreal, Canada, 2006, pp. 835 -840
    • (2006) Proceedings 2006 International Symposium on Industrial Electronics (ISIE2006) , pp. 835-840
    • Obreja, V.V.N.1
  • 7
    • 33847226276 scopus 로고    scopus 로고
    • The reverse leakage current of present-day manufactured silicon PN junctions and their maximum permissible operation temperature
    • Bethesda, USA
    • V.V.N. Obreja, "The reverse leakage current of present-day manufactured silicon PN junctions and their maximum permissible operation temperature", in Proceedings 2005 International Semiconductor Device Research Symposium(ISDRS 2005), Bethesda, USA, 2005, pp. 288-289
    • (2005) Proceedings 2005 International Semiconductor Device Research Symposium(ISDRS , pp. 288-289
    • Obreja, V.V.N.1
  • 8
    • 0024938066 scopus 로고
    • A method for examining failed (shorted) transient voltage suppressors to determine the destructive pulse characteristics
    • Denver, CO, USA
    • A. D. Smith et all, "A method for examining failed (shorted) transient voltage suppressors to determine the destructive pulse characteristics", in Proceedings IEEE 1989 National Symposium on Electromagnetic Compatibility, Denver, CO, USA, 1989, pp. 108-112
    • (1989) Proceedings IEEE 1989 National Symposium on Electromagnetic Compatibility , pp. 108-112
    • Smith, A.D.1    et all2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.