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Volumn , Issue , 2007, Pages 2283-2286

The effect of substrate doping on the behaviour of a CMOS electrothermal frequency-locked-loop

Author keywords

Electrothermal filter; Electrothermal FLL; Thermal diffusivity

Indexed keywords

ACTUATORS; CMOS INTEGRATED CIRCUITS; ELECTRIC HEATING; LOCKS (FASTENERS); MICROSYSTEMS; SUBSTRATES; TEMPERATURE DISTRIBUTION; THERMAL DIFFUSIVITY;

EID: 50049130667     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SENSOR.2007.4300625     Document Type: Conference Paper
Times cited : (9)

References (7)
  • 1
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    • M.A.P. Pertijs, K.A.A. Makinwa and J.H. Huijsing, "A CMOS Temperature Sensor with a 3σ inaccuracy of ±0.1°C from -55°C to 125°C," IEEE Journal of Solid-State Circuits, vol. 40, no. 12, pp. 2805-2815, Dec. 2005.
    • (2005) IEEE Journal of Solid-State Circuits , vol.40 , Issue.12 , pp. 2805-2815
    • Pertijs, M.A.P.1    Makinwa, K.A.A.2    Huijsing, J.H.3
  • 2
    • 0015386259 scopus 로고
    • A thermal oscillator using the thermo-electric (Seebeck) effect in silicon, Soli d-State
    • G. Bosch, "A thermal oscillator using the thermo-electric (Seebeck) effect in silicon," Soli d-State Electronics, vol. 15, pp. 849-852, 1972.
    • (1972) Electronics , vol.15 , pp. 849-852
    • Bosch, G.1
  • 3
    • 33845604389 scopus 로고    scopus 로고
    • A CMOS Temperature-to-Frequency Converter with an Inaccuracy of Less Than ±0.5°C (3σ) from -40 to 105°C
    • Dec
    • K.A.A. Makinwa and M.F. Snoeij, "A CMOS Temperature-to-Frequency Converter with an Inaccuracy of Less Than ±0.5°C (3σ) from -40 to 105°C," IEEE Journal of Solid-State Circuits, vol. 41, no. 12, pp. 2992-2997, Dec. 2006.
    • (2006) IEEE Journal of Solid-State Circuits , vol.41 , Issue.12 , pp. 2992-2997
    • Makinwa, K.A.A.1    Snoeij, M.F.2
  • 4
    • 0020704543 scopus 로고
    • An Ion-Implanted Resistor as Thermal Transient Sensor for the Determination of the Thermal Diffusivity in Silicon
    • P. Turkes, "An Ion-Implanted Resistor as Thermal Transient Sensor for the Determination of the Thermal Diffusivity in Silicon," Phys. Status Solidi A vol. 75, no. 2, pp. 519-523, 1983.
    • (1983) Phys. Status Solidi A , vol.75 , Issue.2 , pp. 519-523
    • Turkes, P.1
  • 5
    • 0015014561 scopus 로고
    • Analysis of Electrothermal Integrated Circuits
    • Feb
    • PR. Gray and D.J. Hamilton, "Analysis of Electrothermal Integrated Circuits," IEEE Journal Solid-State Circuits, vol. 6, no. 1, pp. 8-14, Feb. 1971.
    • (1971) IEEE Journal Solid-State Circuits , vol.6 , Issue.1 , pp. 8-14
    • Gray, P.R.1    Hamilton, D.J.2
  • 6
    • 0035114848 scopus 로고    scopus 로고
    • Thermal Coupling in Integrated Circuits: Application to Thermal Testing
    • Jan
    • J. Altet, et al. "Thermal Coupling in Integrated Circuits: Application to Thermal Testing," IEEE Journal of Solid-State Circuits, vol. 36, no. 1, pp. 81-91, Jan. 2001.
    • (2001) IEEE Journal of Solid-State Circuits , vol.36 , Issue.1 , pp. 81-91
    • Altet, J.1
  • 7
    • 0037091483 scopus 로고    scopus 로고
    • Thermal Conduction in Doped Single-Crystal Silicon Films
    • April
    • M. Asheghi, et al. "Thermal Conduction in Doped Single-Crystal Silicon Films," Journal of Applied Physics, vol. 91, no. 8, pp. 5079-5088, April. 2002.
    • (2002) Journal of Applied Physics , vol.91 , Issue.8 , pp. 5079-5088
    • Asheghi, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.