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Volumn , Issue , 2007, Pages 1175-1178
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In-situ pressure measurements of encapsulated gyroscopes
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Author keywords
Encapsulation test; Gyroscope; Pirani; Vacuum; Wafer level test
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Indexed keywords
ACTUATORS;
CHEMICAL VAPOR DEPOSITION;
GYROSCOPES;
MICROSYSTEMS;
MODEL STRUCTURES;
NONMETALS;
PARAMETER ESTIMATION;
PRESSURE MEASUREMENT;
SENSORS;
SEPARATION;
SILICON;
STRUCTURAL OPTIMIZATION;
TESTING;
TRANSDUCERS;
ANALYTICAL MODELLING;
CORIOLIS;
DESIGN AND OPTIMIZATION;
ENCAPSULATION TEST;
GYROSCOPE;
IN-SITU;
INTERNATIONAL CONFERENCES;
MEASUREMENT ACCURACY;
PIRANI;
PIRANI PRINCIPLE;
SILICON-ON -INSULATOR;
SOLID-STATE SENSORS;
STATIC TESTING;
TECHNOLOGICAL PARAMETERS;
TEST METHODS;
TEST STRUCTURES;
VACUUM;
VIBRATING GYROSCOPES;
WAFER LEVEL TEST;
SILICON ON INSULATOR TECHNOLOGY;
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EID: 50049084061
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/SENSOR.2007.4300345 Document Type: Conference Paper |
Times cited : (12)
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References (6)
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