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Volumn 4, Issue 10, 2007, Pages 3493-3496
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Quantitative chemical analysis of vacancy-solute complexes in metallic solid solutions by coincidence Doppler broadening spectroscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
AL-BASED ALLOYS;
COINCIDENCE DOPPLER BROADENING;
COINCIDENCE DOPPLER BROADENING SPECTROSCOPY;
FIRST-PRINCIPLES CALCULATIONS;
INTERNATIONAL CONFERENCES;
KEY FACTORS;
LINEAR COMBINATION;
LOW BACKGROUND;
MOMENTUM SPECTRUM;
POSITRON ANNIHILATION RADIATION;
POSITRON LIFETIME MEASUREMENTS;
QUANTITATIVE CHEMICAL ANALYSIS;
REFERENCE SPECTRUM;
SUPERSATURATED SOLID SOLUTION;
VACANCY-LIKE DEFECTS;
VACANCY-SOLUTE COMPLEXES;
ALUMINUM;
ALUMINUM CLADDING;
CHEMICAL ANALYSIS;
CHEMICALS;
CHLORINE COMPOUNDS;
COPPER;
CRYSTALLIZATION;
DOPPLER EFFECT;
ELECTRONS;
LIGHT METALS;
METALLIC COMPOUNDS;
METALS;
POSITRON ANNIHILATION;
POSITRON ANNIHILATION SPECTROSCOPY;
SOLID SOLUTIONS;
SOLIDIFICATION;
SOLUTIONS;
SUPERCONDUCTING MATERIALS;
SYSTEMATIC ERRORS;
VACANCIES;
POSITRONS;
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EID: 49949104455
PISSN: 18626351
EISSN: None
Source Type: Journal
DOI: 10.1002/pssc.200675741 Document Type: Conference Paper |
Times cited : (14)
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References (13)
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