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Volumn 41, Issue 16, 2008, Pages
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Structure and magnetic characteristics of nonpolar a-plane GaN : MMMn films
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
ATOMIC FORCE MICROSCOPY;
CRYSTAL ATOMIC STRUCTURE;
CRYSTALLOGRAPHY;
GALLIUM ALLOYS;
GALLIUM NITRIDE;
MAGNETIC ANISOTROPY;
MAGNETIC MATERIALS;
MAGNETIC PROPERTIES;
MANGANESE;
MANGANESE COMPOUNDS;
MICROSCOPIC EXAMINATION;
OPTICAL DESIGN;
QUANTUM INTERFERENCE DEVICES;
RAPID THERMAL ANNEALING;
RAPID THERMAL PROCESSING;
SCANNING PROBE MICROSCOPY;
SEMICONDUCTING GALLIUM;
SINGLE CRYSTALS;
SQUIDS;
SUPERCONDUCTING MAGNETS;
X RAY ANALYSIS;
X RAY DIFFRACTION ANALYSIS;
A-PLANE;
CRYSTAL DETERIORATION;
FERROMAGNETIC PROPERTIES;
GAN FILMS;
HIGH-RESOLUTION X-RAY DIFFRACTION;
IMPLANTATION PROCESS;
LATTICE PARAMETERS;
MAGNETIC CHARACTERISTICS;
MN IONS;
NON-POLAR;
NON-POLAR GAN;
ROOM TEMPERATURES;
RTA PROCESS;
SUPERCONDUCTING QUANTUM INTERFERENCE DEVICE;
XRD ANALYSIS;
IMAGING TECHNIQUES;
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EID: 49749131630
PISSN: 00223727
EISSN: 13616463
Source Type: Journal
DOI: 10.1088/0022-3727/41/16/165004 Document Type: Article |
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Times cited : (14)
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References (9)
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