Enhanced x-ray resolving power achieved behind the focal circles of Cauchois spectrometers

Applied Optics

Volumn 47, Issue 15, 2008, Pages 2767-2778

  Seely, John F ^a   Hudson, Lawrence T ^b   Holland, Glenn E ^c   Henins, Albert ^b  

^a NAVAL RESEARCH LABORATORY   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^c SFA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON SOURCES; GEOMETRY; LASER PRODUCED PLASMAS; X RAY APPARATUS; X RAY SPECTROMETERS; X RAY SPECTROSCOPY;

ANALYTICAL EXPRESSIONS; CRYSTAL SPECTROMETER; GEOMETRICAL MODELING; HARD X-RAY SPECTROSCOPY; INSTRUMENTAL BROADENING; SOURCE CONDITIONS; SPATIAL RESOLUTION; X RAY TRANSITIONS;

SPECTROMETERS;

EID: 49749123048     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.47.002767     Document Type: Article

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