X-ray photoelectron spectroscopy and low-energy electron diffraction analyses on the extremely low work-function surface of W(100) modified by yttrium oxide

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 26, Issue 4, 2008, Pages 1395-1397

  Kawakubo, Takashi ^a   Shimoyama, Yusuke ^a   Nakane, Hideaki ^a   Adachi, Hiroshi ^a  

^a MURORAN INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROACUPUNCTURE; ELECTRON DIFFRACTION; EMISSION SPECTROSCOPY; MOLECULAR ORBITALS; MOLECULAR SPECTROSCOPY; PHOTOELECTRON SPECTROSCOPY; TUNGSTEN; X RAY DIFFRACTION ANALYSIS; YTTRIUM; YTTRIUM OXIDE;

LOW-ENERGY ELECTRON DIFFRACTION; TUNGSTEN TIP; WORK FUNCTIONS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 49749122707     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2956629     Document Type: Article

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