Microstructure and random magnetic anisotropy in Fe-Ni based nanocrystalline thin films

Journal of Physics D: Applied Physics

Volumn 41, Issue 15, 2008, Pages

  Thomas, Senoy ^a   Al Harthi, S H ^b   Sakthikumar, D ^c   Al Omari, I A ^b   Ramanujan, R V ^d   Yoshida, Yasuhiko ^c   Anantharaman, M R ^a  

^a Department of Physics   (India)

^b SULTAN QABOOS UNIVERSITY   (Oman)

^c TOYO UNIVERSITY   (Japan)

^d NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; ANISOTROPY; ANNEALING; COERCIVE FORCE; CRYSTALLOGRAPHY; GRAIN GROWTH; GRAIN SIZE AND SHAPE; IMAGING TECHNIQUES; IRON; MAGNETIC ANISOTROPY; MAGNETIC MATERIALS; MAGNETIC PROPERTIES; MAGNETIC THIN FILMS; MICROSCOPIC EXAMINATION; MICROSTRUCTURE; MOLECULAR ORBITALS; MOLECULAR SPECTROSCOPY; NANOCRYSTALLINE ALLOYS; NANOCRYSTALLINE MATERIALS; NANOSTRUCTURED MATERIALS; NICKEL; NICKEL ALLOYS; OXIDE FILMS; PHOTOELECTRON SPECTROSCOPY; RANDOM PROCESSES; SCANNING TUNNELING MICROSCOPY; SPECTRUM ANALYSIS; THICK FILMS; THIN FILMS;

AMORPHOUS PHASE; AMORPHOUS PRECURSORS; ANNEALING TEMPERATURE; BIPHASIC; COERCIVITY; COERCIVITY DEPENDENCE; CRYSTALLINE PHASE; ENERGY DISPERSIVE X-RAY SPECTROSCOPY; GRAIN SIZES; MAGNETIC STUDIES; NANO-CRYSTALLINE; NANO-CRYSTALLINE THIN FILMS; NANOCRYSTALLINE MICRO-STRUCTURE; NANOCRYSTALLINE PHASE; NATIVE OXIDE LAYERS; PARTIAL CRYSTALLIZATION; RANDOM ANISOTROPY MODEL; RANDOM MAGNETIC ANISOTROPY; SCANNING TUNNELLING MICROSCOPY; TRANSMISSION ELECTRON; VIBRATING-SAMPLE MAGNETOMETER; X-RAY DIFFRACTION;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 49749101204     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/41/15/155009     Document Type: Article

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