A novel ATR FT-IR microspectroscopy technique for surface contamination analysis without interference of the substrate

Analytical Sciences

Volumn 23, Issue 7, 2007, Pages 863-868

  Ekgasit, Sanong ^a   Pattayakorn, Narumon ^a   Tongsakul, Duangta ^a   Thammacharoen, Chuchaat ^a   Kongyou, Tassimon ^b  

^a CHULALONGKORN UNIVERSITY   (Thailand)

^b Central Institute of Forensic Science   (Thailand)

Author keywords

[No Author keywords available]

Indexed keywords

COLLECTOR EFFICIENCY; GERMANIUM METALLOGRAPHY; NONDESTRUCTIVE EXAMINATION;

COLLECTING EFFICIENCY; INFRARED OBJECTIVES; MOLECULAR INFORMATION; NONDESTRUCTIVE CHARACTERIZATION; SOLID SUBSTRATES; SURFACE CONTAMINANTS; SURFACE CONTAMINATION ANALYSIS; THIN ORGANIC FILMS;

CONTAMINATION;

EID: 49749089325     PISSN: 09106340     EISSN: 13482246     Source Type: Journal    
DOI: 10.2116/analsci.23.863     Document Type: Article

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