Inverted spectra of single-wall carbon nanotube films

Journal of Physical Chemistry C

Volumn 112, Issue 31, 2008, Pages 11776-11778

  Lehman, John H ^a   Hurst, Katherine E ^b   Roberson, Lara K ^b   Nield, Kathryn ^b   Hamlin, John D ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b CALLAGHAN INNOVATION   (New Zealand)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; CARBON FILMS; FRUITS; NANOCOMPOSITES; NANOPORES; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOTECHNOLOGY; NANOTUBES; PYROELECTRICITY; REFLECTION; SINGLE-WALLED CARBON NANOTUBES (SWCN); WALLS (STRUCTURAL PARTITIONS);

ABSOLUTE MEASUREMENTS; ABSORBANCE; ABSORBANCE DATA; ABSORBANCE SPECTRUM; DIFFUSE REFLECTANCE MEASUREMENTS; EXCITONIC TRANSITIONS; INVERTED SPECTRA; PYRO-ELECTRIC DETECTORS; SINGLE WALL CARBON NANO TUBES; TRANSMISSIVITY;

CARBON NANOTUBES;

EID: 49649126864     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp804683z     Document Type: Article

References (17)

1. Itkis, M. E.; Perea, D. E.; Niyogi, S.; Rickard, S. M.; Hamon, M. A.; Hu, H.; Zhao, B.; Haddon, R. C. Nano Lett. 2003, 3, 309.
2. Landi, B. J.; Ruf, H. J.; Evans, C. M.; Cress, C. D.; Raffaelle, R. P. J. Phys. Chem. B 2005, 109, 9952.
3. Barnes, T. M.; van de Lagemaat, J.; Levi, D.; Rumbles, G.; Coutts, T. J.; Weeks, C. L.; Britz, D. A.; Levitsky, I.; Peltola, J.; Glatkowski, P. Phys. Rev. B 2007, 75, 235410.
4. Wang, F.; Sfeir, M. Y.; Huang, L.; Huang, X. M. H.; Wu, Y.; Kim, J.; Hone, J.; O'Brien, S.; Brus, L. E.; Heinz, T. F. Phys. Rev. Lett. 2006, 96, 167401.
5. Gilbert, K. E. H.; Lehman, J. H.; Dillon, A. C.; Blackburn, J. L. Appl. Phys. Lett. 2006, 88, 143122.
6. Dillon, A. C.; Parilla, P. A.; Alleman, J. L.; Perkins, J. D.; Heben, M. J. Chem. Phys. Lett. 2000, 316, 13.
7. Dillon, A. C.; Yudasaka, M.; Dresselhaus, M. S. J. Nanosci. Nanotech. 2004, 4, 691.
8. Lehman, J. H.; Eppeldauer, G.; Aust, J. A.; Racz, M. Appl. Opt. 1999, 38, 7047.
9. Peterson, R. L.; Day, G.W.; Gruzensky, P.M.; Phelan, R. J., Jr. J. Appl. Phys. 1974, 45, 3296.
10. Lehman, J. H. NIST Spec. Publ. 1999, 250-53, 1-39.
11. Ugawa, A.; Rinzler, A. G.; Tanner, D. B. Phys. Rev. B 1999, 60, 305.
12. Lehman, J. H.; Hurst, K. E.; Radojevic, A. M.; Dillon, A. C.; Osgood, R. M., Jr. Opt. Lett. 2007, 32, 772.
13. Borondics, F.; Kamarás, K.; Nikolou, M.; Tanner, D. B.; Chen, Z. H.; Rinzler, A. G. Phys. Rev. B 2006, 74, 045431.
14. Johnson, E. G., Jr. Appl. Opt. 1977, 16, 2315.
15. Jorio, A.; Saito, R.; Hertel, T.; Weisman, R. B.; Dresselhaus, G.; Dresselhaus, M. S. MRS Bull. 2004, 29, 276.
16. Pekker, Á.; Borondics, F.; Kamarás, K.; Rinzler, A. G.; Tanner, D. B. Phys. Status Solidi B 2006, 243, 3485.
17. Zhao, B.; Itkis, M. E.; Niyogi, S.; Hu, H.; Zhang, J.; Haddon, R. C. J. Phys. Chem B 2004, 108, 8136.