When size matters-near infrared reflection spectroscopy of nanostructured materials

Journal of Near Infrared Spectroscopy

Volumn 16, Issue 3, 2008, Pages 211-221

  Heigl, Nico ^a   Petter, Christine H ^a   Najam Ul Haq, Mohammad ^a   Rainer, Matthias ^a   Vallant, Rainer M ^a   Bonn, Günther K ^a   Huck, Christian W ^a  

^a UNIVERSITY OF INNSBRUCK   (Austria)

Author keywords

Diffuse reflection; Morphological properties; Nanomaterials; Nanotechnology; Near infrared spectroscopy; Physico chemical properties

Indexed keywords

EID: 49649113216     PISSN: 09670335     EISSN: None     Source Type: Journal    
DOI: 10.1255/jnirs.780     Document Type: Conference Paper

References (36)

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