Continuous wave terahertz spectrometer as a noncontact thickness measuring device

Applied Optics

Volumn 47, Issue 16, 2008, Pages 3023-3026

  Wiik, Rafał ^a,b   Breitfeld, Falk ^a   Mikulics, Martin ^a,c   Koch, Martin ^a  

^a TECHNICAL UNIVERSITY OF BRAUNSCHWEIG   (Germany)

^b MENLO SYSTEMS GMBH   (Germany)

^c FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIPOLE ANTENNAS; SIGNAL TO NOISE RATIO; SPECTROMETERS;

COHERENT DETECTION; CONTINUOUS-WAVE TERAHERTZ; INTEGRATION TIME; MEASURING DEVICE; NON-CONTACT; PEAK SIGNAL TO NOISE RATIO; TERAHERTZ; THICKNESS PROFILES;

TERAHERTZ WAVES;

POLYETHYLENE;

ARTICLE; CHEMISTRY; ELECTRODE; ELECTROMAGNETIC FIELD; EQUIPMENT DESIGN; LASER; METHODOLOGY; OPTICS; QUALITY CONTROL; SPECTROPHOTOMETRY; TEMPERATURE; TIME;

ELECTRODES; ELECTROMAGNETICS; EQUIPMENT DESIGN; LASERS; OPTICS; POLYETHYLENE; QUALITY CONTROL; RESEARCH DESIGN; SPECTROPHOTOMETRY; TEMPERATURE; TIME FACTORS;

EID: 49649109899     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.47.003023     Document Type: Article

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