A new paradigm for ultra-high-resolution imaging at elevated temperatures

Microscopy and Microanalysis

Volumn 14, Issue SUPPL. 2, 2008, Pages 792-793

  Allard, L F ^a   Bigelow, W C ^b   Nackashi, D ^c   Damiano, J ^c   Mick, S E ^c  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF MICHIGAN   (United States)

^c Protochips Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 49549108897     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927608086406     Document Type: Conference Paper

References (2)

1. R. Sharma, Microscopy & Microanalysis (2001), 7: 494-506, Cambridge University Press
2. This research was performed at the Oak Ridge National Laboratory (ORNL) and sponsored by Protochips Inc. through the Work-for-Others Program, IAN # 14B569801, with the U.S. Department of Energy under contract DE-AC05-00OR22725 with UT-Battelle, LLC and SBIR grant DE-FG02-05ER84252 with Protochips, Inc..